(SCI) Analysis of Voltage Noises for the Reliability Improvement of the KSTAR CS Quench Detection - SCI
페이지 정보
작성일 23-12-04 11:31| Journal | IEEE Transactions on Applied Superconductivity |
| Author | G. Baek, J. Kim, H. Kang, T. K. Ko and Y. Chu, |
| Year | 2018 |
| Date | 2018.06 |
본문
G. Baek, J. Kim, H. Kang, T. K. Ko and Y. Chu, "Analysis of Voltage Noises for the Reliability Improvement of the KSTAR CS Quench Detection," in IEEE Transactions on Applied Superconductivity, vol. 28, no. 4, pp. 1-4, June 2018, Art no. 4701904, doi: 10.1109/TASC.2018.2802651.
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